Temperature measurement system and method using optical signal transmission through an optical interferometer

A temperature measurement system on a chip, comprising:

• an optical signal generator configured to generate an input optical signal at a predetermined wavelength;
• an interferometer that includes:
• a beam splitter configured to split the input optical signal into a first beam and a second beam;
• a first arm coupled to the beam splitter to receive and optically transmit the first beam;
• a second arm coupled to the beam splitter to receive and optically transmit the second beam, wherein the second arm introduces a phase shift in the second beam relative to the first beam to produce a phase-shifted second beam;
• and
• a beam combiner coupled to the first arm and the second arm, wherein the beam combiner is configured to receive the first beam and the phase-shifted second beam and combine at least a portion of the first beam and the phase-shifted second beam to produce an output optical signal;
• an optical signal detector coupled to the beam combiner, wherein the optical signal detector is configured to measure an optical signal intensity of the output optical signal and produce a measured optical signal intensity of the interferometer;
• a reference arm through which at least a portion of the input optical signal is transmitted to produce a reference output optical signal;
• and
• an optical signal detector coupled to the reference arm to receive the reference output optical signal and measure an optical signal intensity of the reference output optical signal to produce a measured optical signal intensity of the reference arm,
• wherein the measured optical signal intensity of the interferometer is normalized by the measured optical signal intensity of the reference arm to produce a normalized measured optical signal intensity of the interferometer;
• and
• a processor configured to correlate the normalized measured optical signal intensity of the interferometer with a temperature.