Back to results
US 11,906,329 B2Granted
Testing apparatus for electronic or electro-mechanical feedback devices
AssigneeOctava Engineering, LLC
InventorsClint Switzer, Nishant Pathak
Life of this patent
Estimating the term…
Abstract
A testing apparatus and method for detecting faults in encoders are disclosed. The testing apparatus includes a signal conditioning circuit board that receives an encoder signal and a central processing unit in communication with the circuit board and configured to: check for faulty amplitude, check for signal symmetry, check for signal offset, and/or check for signal transmission rate. The testing apparatus includes a real-time controller for real-time signal processing and fault detection.
Claims18
A testing apparatus for feedback devices, comprising:
- a signal conditioning circuit board that receives a feedback signal;
- a central processing unit in communication with the signal conditioning circuit board, the central processing unit configured to:
- perform a power check by measuring a voltage and an amperage of the feedback signal, and comparing the measured voltage and the measured amperage to a predefined voltage range and a predefined amperage range, respectively;
- check for faulty amplitude by measuring both a high state amplitude and a low state amplitude of the feedback signal, and comparing the high state signal amplitude and the low state signal amplitude to a corresponding predefined amplitude range;
- and
- check for signal symmetry by measuring a duty cycle of the feedback signal, and continually comparing an ON time and an OFF time of the signal to determine if a ratio of the ON time to the OFF time falls within a predefined symmetry threshold.
3 more elements
A testing apparatus for encoders, comprising:
- a signal conditioning circuit board that receives an encoder signal;
- and
- a central processing unit in communication with the signal condition circuit board, the central processing unit configured to:
- check for faulty amplitude by measuring a high state amplitude and a low state amplitude of the encoder signal, and comparing the high state signal amplitude and the low state signal amplitude to a predefined amplitude range;
- check for signal symmetry by measuring a duty cycle of the encoder signal, and continually comparing an ON time and an OFF time of the signal to determine if a ratio of the ON time to the OFF time falls within a predefined symmetry threshold;
- check for signal offset by comparing a phase angle of the encoder signal with that of a complementary signal, and determine if a phase difference of the signals falls within a predefined offset threshold;
- and
- check for signal transmission rate by measuring a rate at which the encoder signal is received, and comparing the measured rate to a predefined rate threshold.
5 more elements
A method for testing an encoder, comprising:
- checking for faulty amplitude by measuring both a high state amplitude and a low state amplitude of an encoder signal, and comparing the high state signal amplitude and the low state signal amplitude to a corresponding predefined amplitude range;
- checking for signal symmetry by measuring a duty cycle of the encoder signal, and comparing an ON time and an OFF time of the signal to determine if a ratio of the ON time to the OFF time falls within a predefined symmetry threshold;
- checking for signal offset by comparing a phase angle of the encoder signal with that of a complementary signal, and determine if a phase difference of the signals falls within a predefined offset threshold;
- and
- checking for signal transmission rate by measuring a rate at which the encoder signal is received, and comparing the measured rate to a predefined rate threshold;
- wherein comparing the ON time and the OFF time of the signal includes continually comparing the ON time and the OFF time of the signal to determine if the ratio of the ON time to the OFF time falls within the predefined symmetry threshold.
3 more elements
Dependencies are inferred from the claim text.