Inertial measurement circuit, corresponding device and method

A device, comprising:

• a circuit, comprising:
• an inertial measurement unit configured to be oscillated via a driving signal provided by driving circuitry;
• a lock-in amplifier configured to:
• receive a sensing signal from the inertial measurement unit and a reference demodulation signal which is a function of the driving signal, and
• provide an inertial measurement signal based on the sensing signal, wherein the reference demodulation signal is affected by a variable phase error;
• phase meter circuitry configured to:
• receive the driving signal and the sensing signal, and
• provide, as a function of a phase difference between the driving signal and the sensing signal, a phase correction signal for the reference demodulation signal;
• and
• a correction node configured to apply the phase correction signal to the reference demodulation signal so that, in response to the phase correction signal being applied to the reference demodulation signal, the phase error is maintained in a vicinity of a reference value;
• and
• user circuitry coupled to the lock-in amplifier in the circuit,
• wherein the user circuitry is configured to exploit the inertial measurement signal produced by the lock-in amplifier.

A method comprising:

• oscillating an inertial measurement unit via a driving signal provided by driving circuitry;
• receiving, by a lock-in amplifier, a sensing signal from the inertial measurement unit and a reference demodulation signal which is a function of the driving signal;
• providing, by the lock-in amplifier, an inertial measurement signal based on the sensing signal and the reference demodulation signal, wherein the reference demodulation signal is affected by a variable phase error,
• receiving, by a phase meter circuitry, the driving signal and the sensing signal, and providing, as a function of a phase difference between the driving signal and the sensing signal, a phase correction signal for the reference demodulation signal;
• and
• applying, by a correction node, the phase correction signal to the reference demodulation signal of the lock-in amplifier so that, in response to the phase correction signal being applied to the reference demodulation signal of the lock-in amplifier, the phase error is maintained in a vicinity of a reference value.