Offset well analysis using well trajectory similarity
AssigneeSchlumberger Technology Corporation
InventorsVladimir Zhernakov, Xiaotong Suo, Jose Celaya Galvan, Velizar Vesselinov, Neil Holger White Eklund
Life of this patent
Estimating the term…
Loading patent…
AssigneeSchlumberger Technology Corporation
InventorsVladimir Zhernakov, Xiaotong Suo, Jose Celaya Galvan, Velizar Vesselinov, Neil Holger White Eklund
Estimating the term…
A method for offset well analysis includes receiving offset well data collected from an offset well, the offset well data including data representing a trajectory of an offset well, receiving subject well data comprising a trajectory of at least a portion of a subject well, partitioning the trajectory of the offset well into a plurality of offset well segments, partitioning the trajectory of the subject well into a plurality of subject well segments, determining a distance between at least some of the plurality of offset well segments and at least some of the plurality of subject well segments, selecting the offset well based in part on the distance, and performing an offset well analysis using the offset well and the subject well.
A method for offset well analysis, comprising:
A computing system, comprising:
A non-transitory computer-readable medium storing instructions that, when executed by one or more processors of a computing system, cause the computing system to perform operations, the operations comprising:
Dependencies are inferred from the claim text.