Multi-axis test equipment
AssigneeMilliwave Silicon Solutions, Inc.
InventorsJeanMarc Laurent, Chinh Doan
Life of this patent
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Abstract
Embodiments herein relate to a testing apparatus for coupling with a device-under-test (DUT). The apparatus may include a base portion configured to couple to a testing platform, wherein the base portion is configured to rotate the DUT around a first axis. The apparatus may further include an arm portion configured to rotate the DUT around a second axis perpendicular to the first axis. The apparatus may further include a platform portion configured to couple to the DUT. Other embodiments may be described and claimed.
Claims17
A testing apparatus for coupling with a device-under-test (DUT), wherein the apparatus comprises:
- a base portion configured to couple to a surface wherein the base portion is configured to rotate the DUT around a first axis;
- an arm portion coupled with the base portion, wherein the arm portion is configured to rotate the DUT around a second axis perpendicular to the first axis;
- and
- a platform portion coupled to the arm portion, wherein the platform portion is configured to couple to the DUT such that at least a portion of the DUT remains approximately at an intersection of the first and second axes;
- wherein a width of the arm portion is selectively adjustable based on a size of the DUT, and wherein the width of the arm portion is measured in a direction parallel to the second axis.
An apparatus comprising:
- a testing platform;
- and
- a testing apparatus to couple to a device-under-test (DUT) that includes a millimeter-wave (mmWave) antenna or a terahertz (THz)-frequency antenna, wherein the apparatus comprises:
- a base portion coupled to the testing platform, wherein the base portion is configured to rotate the DUT around an Azimuth axis;
- an arm portion coupled to the base portion, wherein the arm portion has a width that is selectively adjustable based on a size of the DUT, wherein the width is measured parallel to an Elevation axis that is perpendicular to the Azimuth axis, and wherein the arm portion is configured to rotate the DUT around the Elevation axis;
- and
- a platform portion coupled with the base portion, wherein the platform portion is configured to couple to the DUT, wherein the platform portion is configured to rotate the DUT around a Polarization axis that is perpendicular to the Elevation axis and the Azimuth axis, wherein the Polarization axis is coincident with an axis of radiation of the DUT, and wherein the platform portion is adjustable such that an element of the platform portion that is to attach to the DUT is movable along the Polarization axis.
A testing apparatus for coupling with a device-under-test (DUT), wherein the apparatus comprises:
- a base portion configured to couple to a surface, wherein the base portion is configured to rotate the DUT around a first axis;
- an arm portion coupled to the base portion, the arm portion configured to rotate the DUT around a second axis perpendicular to the first axis;
- and
- a platform portion coupled to the arm portion, the platform portion configured to couple to the DUT and rotate the DUT around a third axis that is perpendicular to the first and second axis and coincident with the axis of radiation of the DUT, and wherein the platform portion is adjustable such that an element of the platform portion that is to attach to the DUT is movable along the third axis.
Dependencies are inferred from the claim text.