System identification method, system identification device, and program
AssigneeMeidensha Corporation
InventorTakao Akiyama
Life of this patent
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AssigneeMeidensha Corporation
InventorTakao Akiyama
Estimating the term…
This system identification method includes: a step (S1) for measuring frequency responses (ω, HR1), (ω, HR2) . . . , and (ω, HRn) in a real system under n sets of disturbances of different magnitudes; a step (S3) for calculating frequency responses (ω, HM1), (ω, HM2) . . . , (ω, HMn) from input to output in n sets of mechanical models M1 to Mn including i sets (i is an integer of 1 or greater) of common parameters that do not change due to disturbance and j sets of disturbance variable parameters that do change due to disturbance; a step (S4) for calculating the values of a total of n sets of evaluation functions F (HRk, HMk) and the sum σF thereof, and steps (S3 to S6) for searching for the values of i sets of common parameters and j×n sets of disturbance variable parameters for which the sum σF would meet convergence conditions.
A system identification method that identifies, by a computer, values of a plurality of model parameters included in a model that reproduces input-output characteristics from input to output in a dynamometer system that includes a test piece and a dynamometer coupled to the test piece, the method comprising the steps of:
Dependencies are inferred from the claim text.