Multi-point measurement system and method thereof

A multi-point measurement system for measuring a device under test, comprising:

• a plurality of sensors respectively attached to a plurality of measuring points of the device under test;
• and
• a computing device including a computing unit and a storage unit, the computing unit including a learning module, the computing device establishing communication connections to the sensors, respectively,
• wherein the sensors are configured to generate a plurality of original sensing data and transmit the plurality of original sensing data to the storage unit for storage;
• wherein the computing unit is configured to input processed sensing data obtained by preprocessing the original sensing data to the learning module for data analysis, and is configured to obtain a plurality of reference values corresponding to the sensors, respectively;
• wherein the plurality of sensors form a plurality of groups;
• each group includes at least two adjacent sensors;
• for each group, the computing unit is configured to input the processed sensing data corresponding to the sensors in the group to the learning module for merge operation, and is configured to obtain a plurality of merged reference values corresponding to the groups, respectively;
• wherein the computing unit is configured to perform a determination operation through comparing the merged reference value corresponding to each group and the reference values corresponding to the sensors in the group so as to generate a suitability determination for the measuring points;
• wherein the measuring points include a first measuring point and a second measuring point adjacent to each other;
• the plurality of groups includes a first group including a first sensor and a second sensor of the plurality of sensors, the first sensor is located at the first measuring point, and the second sensor is located at the second measuring point;
• the reference values corresponding to the sensors in the first group include a first reference value and a second reference value, the first reference value corresponds to the first sensor, and the second reference value corresponds to the second sensor;
• the merged reference value corresponding to the first group is a first merged reference value, the first merged reference value corresponds to the first sensor and the second sensor;
• and
• the determination operation performed on the first group is a first determination operation, the first determination operation includes:
• the computing unit compares each of the first reference value and the second reference value to the first merged reference value:
• and
• when both the first reference value and the second reference value are larger than the first merged reference value, the computing unit determines that one of the first measuring point and the second measuring point is unsuitable, wherein the unsuitable measuring point is removed and the computing unit performs a second determination operation.