Pin hole inspection apparatus and method
AssigneeSK Siltron Co., Ltd.
InventorsChang Rak Kim, Jin Ho Kang
Life of this patent
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AssigneeSK Siltron Co., Ltd.
InventorsChang Rak Kim, Jin Ho Kang
Estimating the term…
Disclosed are a pin hole inspection apparatus and method for determining whether or not the vacuum-packed state of a Front Opening Shipping Box (FOSB) vacuum-packed with film paper is defective. The pin hole inspection apparatus includes a receiving unit configured such that the FOSB vacuum-packed with the film paper is received thereon and supported thereby, an adsorption unit vacuum-adsorbed onto a target part of the film paper, configured to surround the FOSB received on and supported by the receiving unit, so as to pull the film paper, a displacement measurement unit configured to measure a degree of swelling of the film paper pulled through the adsorption unit, and a processing unit configured to determine whether or not a pin hole is generated by comparing a measurement displacement value acquired through the displacement measurement unit with a pre-stored reference displacement value.
A pin hole inspection apparatus for determining whether or not a vacuum-packed state of a Front Opening Shipping Box (FOSB) vacuum-packed with film paper is defective, the pin hole inspection apparatus comprising:
A pin hole inspection apparatus for determining whether or not a vacuum-packed state of a Front Opening Shipping Box (FOSB) vacuum-packed with film paper is defective, the pin hole inspection apparatus comprising:
A pin hole inspection method for determining whether or not a vacuum-packed state of a Front Opening Shipping Box (FOSB) vacuum-packed with film paper is defective, the pin hole inspection method comprising:
Dependencies are inferred from the claim text.