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US 11,808,566 B2Granted
Automated dynamic dimensional measurement systems and methods
AssigneeGagemaker, LP
InventorsEric Otten, Howard Thomas
Life of this patent
Estimating the term…
Abstract
A method system of reducing operator-induced error in measurements comprises a measurement tool, such as a diameter gage, that is configured to communicate electrical signals representative of measurements to a computing device, which is configured to receive the signals and to determine a value for the measurement without the operator having to interact with the tool to zero the gage, acquire the data or transmit the data.
Claims17
A method of measuring, comprising:
- providing a metrological instrument structured to be operatively held by a human hand and wherein the metrological instrument transduces one or more dimensions of a product artifact into one or more electrical signals representative of the one or more dimensions of the product artifact;
- engaging the metrological instrument with the product to be measured;
- automatically acquiring during the first period without human intervention or activation a plurality of signals representative of a dimension of the product artifact;
- and
- indicating that the first period is elapsing, that the first period has expired, or a combination of both.
2 more elements
A method of measuring, comprising:
- providing a metrological instrument structured to be operatively held by a human hand and wherein the metrological instrument transduces one or more dimensions of a product artifact into one or more electrical signals representative of the one or more dimensions of the product artifact, and wherein the metrological instrument indicates that a first period is elapsing, that the period has expired, or a combination of both;
- engaging the metrological instrument with the product to be measured;
- automatically acquiring without human intervention or activation a plurality of signals representative of a dimension of the product artifact;
- and
- providing a computing device remote from the metrological instrument wherein the computing device receives the signals representative of the one or more dimensions of the product artifact and wherein the metrological instrument and computing device are configured to communicate wirelessly.
2 more elements
Dependencies are inferred from the claim text.