Method and apparatus for optical ice detection
AssigneeUniversity of Wyoming
InventorWilliam D. Rice
Life of this patent
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Abstract
In an embodiment, an optical ice detection method is provided. The method includes contacting a multilayer structure with water under conditions effective to form ice, the multilayer structure comprising an optically transparent or semi-transparent material disposed over at least a portion of a material probe. The method further includes performing Raman spectroscopy on one or more of the material probe, water, or ice to obtain Raman spectra, detecting a shift in the Raman spectra, and calculating ice-induced strain in the material probe. Apparatus for optically detecting ice are also provided.
Claims20
An optical ice detection method, comprising:
- contacting a multilayer structure with water under conditions effective to form ice, the multilayer structure comprising an optically transparent or semi-transparent material disposed over at least a portion of a material probe;
- performing Raman spectroscopy on one or more of the material probe, the water, or the ice to obtain Raman spectra;
- detecting a shift in the Raman spectra;
- and
- calculating ice-induced strain in the material probe.
A method of detecting ice, comprising:
- contacting a multilayer structure with water under conditions effective to form ice, the multilayer structure comprising an optically transparent or semi-transparent material disposed over at least a portion of a material probe, the material probe comprising Si, SiGe, Ge, graphene, carbon nanotubes, transition-metal dichalcogenides, two-dimensional atomic layers from bulk crystals, quantum wells, pressed powders, nanoparticles, quantum dots, or a combination thereof;
- performing Raman spectroscopy on one or more of the material probe, the water, or the ice to obtain Raman spectra;
- detecting a change in the Raman spectra;
- and
- calculating ice-induced strain in the material probe.
An apparatus for optically detecting ice, comprising:
- a multilayer structure comprising an optically transparent layer or semi-transparent layer disposed over at least a portion of a material probe, the material probe comprising Si, SiGe, Ge, graphene, carbon nanotubes, transition-metal dichalcogenides, two-dimensional atomic layers from bulk crystals, quantum wells, pressed powders, nanoparticles, quantum dots, or a combination thereof;
- and
- a Raman probe to detect a shift in Raman spectra, the Raman probe optically coupled to the multilayer structure.
Dependencies are inferred from the claim text.