Atomic force microscope
AssigneesParis Sciences Et Lettres, Centre National de la Recherche Scientifique (CNRS), Sorbonne Universite, Université Paris Cité
InventorsAntoine Niguès, Alessandro Siria
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Abstract
The present invention relates to an atomic force microscope for evaluating a surface of a sample, comprising a sample holder, having a first zone suitable for receiving the sample mounted in a stationary manner, a probe having a tip able to be positioned facing the surface of the sample, the microscope being configured to allow an adjustment of a position of the tip relative to the surface, and a support, the sample holder having at least one second zone, separate from the first zone and stationary relative to the support, the sample holder being deformable so as to allow a relative movement of the first zone with respect to the second zone, and the microscope comprising a detector able to detect a movement of the first zone relative to the second zone.
Claims25
An atomic force microscope for evaluating a surface of a sample, comprising:
- a sample holder comprising a first area configured to receive the sample fixedly mounted with respect to the first area,
- a probe comprising a tip configured to be positioned facing the surface of the sample, the microscope being configured to allow an adjustment of a position of the tip with respect to the surface,
- a support,
- wherein
- the sample holder has at least a second area distinct from the first area and fixed with respect to the support, the sample holder being deformable so as to authorize a relative displacement of the first area with respect to the second area,
- the microscope comprises a detector configured to detect a displacement of the first area with respect to the second area,
- the microscope being configured to evaluate an interaction between the surface and the tip base on a measurement of the displacement of the first area of the sample holder by the detector.
Dependencies are inferred from the claim text.