Holder system
AssigneeWinbond Electronics Corp.
InventorHsueh-Cheng Liao
Life of this patent
Estimating the term…
Abstract
A holder system for a scanning probe microscope, including a holder and a fixer. The holder includes a holder top surface, and a holder sidewall. The holder top surface is configured to hold a sample. The holder sidewall extends from the holder top surface. The fixer includes a fixer fixing portion, and a fixer connecting portion. The fixer fixing portion is configured to affix the sample to the holder top surface. The fixer connecting portion is connected to the fixer fixing portion, and is affixed to the holder sidewall. An area to-be-tested of the sample is exposed to the fixer fixing portion.
Claims13
A holder system for a scanning probe microscope, comprising:
- a holder, comprising:
- a holder top surface, configured to hold a sample;
- and
- a holder sidewall, extending from the holder top surface;
- and
- a fixer, comprising:
- a fixer fixing portion, configured to affix the sample to the holder top surface;
- and
- a fixer connecting portion, connected to the fixer fixing portion, and being fixed to the holder sidewall,
- wherein an area to-be-tested of the sample is exposed to the fixer fixing portion.
A holder system for a scanning probe microscope, comprising:
- a holder, comprising:
- a holder top surface, having a platform structure, and configured to hold a sample;
- and
- a holder sidewall, connected to the holder top surface;
- and
- a fixer, comprising:
- a fixer fixing portion, configured to press the sample on the holder top surface;
- and
- a fixer connecting portion, connected to the fixer fixing portion,
- wherein the fixer connecting portion is affixed to the holder sidewall,
- wherein there is a gap between the fixer and the holder top surface.
Dependencies are inferred from the claim text.