Integrated channel diode
AssigneeTexas Instruments Incorporated
InventorsChristopher Boguslaw Kocon, Simon John Molloy, John Manning Savidge Neilson, Hideaki Kawahara
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AssigneeTexas Instruments Incorporated
InventorsChristopher Boguslaw Kocon, Simon John Molloy, John Manning Savidge Neilson, Hideaki Kawahara
Estimating the term…
A semiconductor device includes a vertical drift region over a drain contact region, abutted on opposite sides by RESURF trenches. A split gate is disposed over the vertical drift region. A first portion of the split gate is a gate of an MOS transistor and is located over a body of the MOS transistor over a first side of the vertical drift region. A second portion of the split gate is a gate of a channel diode and is located over a body of the channel diode over a second, opposite, side of the vertical drift region. A source electrode is electrically coupled to a source region of the channel diode and a source region of the MOS transistor.
A method of manufacturing a semiconductor device, comprising:
A method of forming an integrated circuit, comprising:
A method of manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.