Defect weight formulas for analog defect simulation

A method for performing an analog defect simulation on an electronic device, the method comprising:

• generating, by a computer system, a defect catalog which identifies a plurality of defect classes relating to a plurality of defects and a plurality of modeling parameters that are associated with the plurality of defect classes;
• identifying, by the computer system, a defect weight formula that specifies a weight for a defect class from among the plurality of defect classes in relation to a corresponding modeling parameter from among the plurality of modeling parameters;
• calling, by the computer system, a defect weight function to return the weight from the defect weight formula;
• performing, by the computer system, the analog defect simulation on the electronic device;
• and
• determining, by the computer system, a simulation statistic relating to the analog defect simulation utilizing the weight.

A computer system for performing an analog defect simulation on analog components of an electronic device, the computer system comprising:

• a memory that stores a defect weight function having a defect weight formula that specifies a weight for a defect class from among a plurality of defect classes identified in a defect catalog;
• and
• a processor configured to execute a plurality of instructions, the plurality of instructions, when executed by the processor, configuring the processor to:
• call the defect weight function stored in the memory to return the weight from the defect weight formula;
• perform the analog defect simulation on the electronic device;
• and
• determine a simulation statistic relating to the analog defect simulation utilizing the weight.