US 11,442,102 B2 · Test and measurement system for parallel waveform analysis

Abstract

A test and measurement system for parallel waveform analysis acquires waveforms resulting from performing tests on a device under test (DUT) and performs, at least partially in parallel, respective analyses of the waveforms resulting from performing tests on the DUT. The system also acquires a first waveform resulting from performing a first test with an oscilloscope on a DUT and performs analysis of the first waveform at least partially in parallel with acquiring a second waveform. Additionally, the system tracks a plurality of testing assets using inventory information of a plurality of testing equipment on the network and enables remote users to access equipment logs and results of the respective analyses of the waveforms stored on a cloud computing system for performance of analytics.

Claims28

Dependent claims

A method for testing a device under test (DUT) in a test and measurement system, comprising:

acquiring, by a testing asset of the test and measurement system, a first waveform from the DUT resulting from performing a first test on the DUT;
in response to the acquiring of the first waveform resulting from performing the first test on the DUT:
beginning to analyze the first waveform resulting from performing the first test on the DUT;
and
while analyzing the first waveform resulting from performing the first test on the DUT, beginning to acquire, by the testing asset of the test and measurement system, a second waveform from the DUT resulting from performing a second test on the DUT;
and
in response to acquiring the second waveform resulting from performing the second test on the DUT:
while analyzing the first waveform resulting from performing the first test on the DUT, beginning to analyze the second waveform resulting from performing the second test on the DUT.

5 more elements

A non-transitory computer-readable storage medium, having computer executable instructions stored thereon that, when executed by at least one processor, cause the at least one processor to:

acquire, by a testing asset of a test and measurement system, a first waveform from a device under test (DUT) resulting from performing a first test on the DUT;
in response to acquiring the first waveform:
begin to perform an analysis of the first waveform;
and
at least partially in parallel with performing the analysis of the first waveform, begin to acquire, by the testing asset of the test and measurement system, a second waveform from the DUT resulting from performing a second test on the DUT;
and
in response to acquiring the second waveform:
at least partially in parallel with performing the analysis of the first waveform, begin to perform an analysis of the second waveform.

5 more elements

Dependencies are inferred from the claim text.

Test and measurement system for parallel waveform analysis

Life of this patent

Test and measurement system for parallel waveform analysis

Life of this patent

Abstract

Claims28