Testing device and testing method for performing an electrical stress test and a power-on test on an array substrate of a dispaly panel

A testing device for testing array substrates for a display panel, comprising:

• a worktable, configured to place a plurality of array substrates to be tested;
• testing interfaces disposed on the worktable and corresponding to each of the array substrates;
• and
• testers disposed on the worktable and matched with the testing interfaces to carry out an electrical stress test and a power-on test on the array substrates;
• there are at least two testers, and the testers synchronously operate according to a preset scheme, wherein the at least two testers are all disposed above the plurality of array substrates for performing the electrical stress test and the power-on test on the array substrates;
• wherein the testers comprise a first tester and a second tester;
• the first tester is located in front of the second tester in a testing direction by a distance of at least one row of one or more array substrates;
• and the preset scheme comprises:
• the first tester carries out the electrical stress test on the plurality of array substrates successively on a one-row-by-one-row basis, and the second tester carries out the power-on test on each row of the plurality of array substrates that has finished the electrical stress test performed by the first tester;
• wherein the plurality of array substrates are mounted on the worktable in aligned rows and columns, and each row comprises at least one aligned array substrate, wherein the first tester and the second tester are each disposed in parallel with a row orientation of the array substrates, wherein initially the first tester is placed at one end of a second row at which the testing interfaces of the at least one aligned array substrate of the second row are disposed, and the second tester is placed at one end of a first row where the testing interfaces of the at least one aligned array substrate of the first row are disposed, and wherein since this time the first tester is configured to perform the electrical stress test on the at least one aligned array substrate of the second row simultaneously and then relatively move to the third row and perform the electrical stress test on the at least one array substrate of the third row simultaneously, and at same steps the second tester is configured to perform the power-on test on the at least one aligned array substrate of the first row simultaneously and then relatively move to the second row and perform the power-on test on the at least one aligned array substrate of the second row simultaneously which has finished the electrical stress test performed by the first tester, and wherein the above process is continued until the first tester reaches the last row and both the electrical stress test and the power-on test have been performed on each of the plurality of array substrates.