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US 11,442,098 B2Granted
Generating a waveform based on digital pulses
AssigneeTeradyne, Inc.
InventorsBrian Charles Wadell, Richard Pye
Life of this patent
Estimating the term…
Abstract
Example automatic test equipment (ATE) includes a first test instrument to receive a waveform from a device under test, where the waveform is based on test signals sent from the ATE to the DUT; circuitry to generate digital pulses based on the waveform; and a second test instrument to receive the digital pulses over at least two digital pins and to process the digital pulses to test the DUT.
Claims40
Automatic test equipment (ATE) comprising:
- a first test instrument comprising digital pins that is capable of performing device testing, the first test instrument being configured to output pulses on at least two of the digital pins, where a first digital pin is for pulses having a positive polarity and a second digital pin is for pulses having a negative polarity;
- circuitry comprising an adder to receive the pulses from the at least two digital pins and to combine the pulses to produce a signal and to generate a waveform based on the signal;
- and
- a second test instrument that is capable of performing device testing, the second test instrument being configured to perform one or more tests on a device under test (DUT) based on the waveform, the second test instrument comprising a connection to a transmission line to output a test signal based on the waveform to the DUT to test the DUT;
- wherein the device testing that the first test instrument is capable of performing and the device testing that the second test instrument is capable of performing each comprises outputting test signals to a respective device, receiving response signals based on the test signals, and processing the response signals.
2 more elements
A method of producing a waveform, comprising:
- outputting pulses on at least two digital pins of a first test instrument in automatic test equipment (ATE), the first test instrument being capable of performing device testing and generating the pulses, where a first digital pin is for pulses having a positive polarity and a second digital pin is for pulses having a negative polarity;
- combining the pulses to produce a signal;
- generating the waveform based on the signal;
- and
- a second test instrument that is capable of performing device testing, the second test instrument performing, based on the waveform, one or more tests on a device under test (DUT) being tested by the ATE, the second test instrument comprising a connection to a transmission line to output a test signal based on the waveform to the DUT to test the DUT;
- wherein the device testing that the first test instrument is capable of performing and the device testing that the second test instrument is capable of performing each comprises outputting test signals to a respective device, receiving response signals based on the test signals, and processing the response signals.
3 more elements
Dependencies are inferred from the claim text.