Adaptive power measurement accumulator with a changing sampling frequency

A method, comprising

• with a sampling circuit, initially making electrical measurements of a unit under test at a first sampling frequency including a plurality of first electrical measurements at the first sampling frequency;
• with an accumulator, accumulating electrical measurements of the unit under test;
• with an adaptive circuit, determining a change in sampling frequency from the first sampling frequency to a second sampling frequency;
• with the sampling circuit, making a plurality of second electrical measurements at the second sampling frequency after determining the change in sampling frequency;
• with the adaptive circuit, adjusting a value of the second electrical measurements according to a factor, wherein the factor is a multiplication factor, the factor based on a relationship between the first sampling frequency and the second sampling frequency, to yield a plurality of adjusted second electrical measurements;
• and
• with the accumulator, accumulating the plurality of adjusted second electrical measurements with the plurality of first electrical measurements.

A system, comprising:

• a processor;
• and
• a power meter, including:
• a sampling circuit to initially make electrical measurements of a unit under test at a first sampling frequency;
• an adaptive circuit;
• and
• an accumulator to accumulate electrical measurements of the unit under test from the sampling circuit including a plurality of first electrical measurements at the first sampling frequency;
• wherein, after a change in sampling frequency from the first sampling frequency to a second sampling frequency:
• the sampling circuit is to make a plurality of second electrical measurements at the second sampling frequency;
• the adaptive circuit is to adjust a value of the plurality of second electrical measurements from the sampling circuit according to a factor, wherein the factor is a multiplication factor, the factor based on a relationship between the first sampling frequency and the second sampling frequency, to yield a plurality of adjusted second electrical measurements;
• the accumulator is to accumulate the plurality of adjusted second electrical measurements;
• and
• the accumulator is to provide an accumulation of adjusted second electrical measurements to the processor with the first electrical measurements.