Contact probe and relative probe head of an apparatus for testing electronic devices

A probe head for testing electronic devices, comprising:

• a plurality of contact probes;
• and
• a first and second plate-shaped supports separated one another by a suitable air gap,
• the first and second plate-shaped supports having a plurality of guide holes for slidingly housing the plurality of contact probes,
• wherein each contact probe includes:
• respective first and second end portions;
• and
• a probe body extended in a longitudinal direction between the first and second end portions, the first end portion having transverse dimensions greater than the probe body,
• the contact probe including material scraps due to a separation from a substrate wherein the contact probe is realized and the first end portion includes only one enlarged portion projecting in correspondence of a first side wall of the contact probe and the only one enlarged portion includes at least one indentation configured to house the material scraps being on the contact probe.

A contact probe, comprising:

• respective first and second end portions;
• a probe body extended in a longitudinal direction between the first and second end portions;
• and
• a first side wall and a second side wall, opposite one another,
• wherein the first end portion is a contact head configured to abut onto a contact pad of a space transformer and the second end portion is a contact tip configured to abut onto a contact pad of a device under test and the first end portion having transverse dimensions greater than the probe body,
• the contact probe includes material scraps due to a separation from a substrate wherein the contact probe is realized by laser cutting,
• wherein the first end portion includes only one enlarged portion, projecting in correspondence of a first side wall of the contact probe and the only one enlarged portion includes at least one indentation configured to house the material scraps being on the contact probe.