Distance measurements using spectrometer systems

A method comprising:

• emitting, using a light source of a system, light within a first range of wavelengths in a field of illumination;
• measuring, using a first spectrometer of the system, first sample light reflected from an object within a second range of wavelengths and in a first field of detection, the second range of wavelengths being a subset of the first range of wavelengths;
• measuring, using a second spectrometer of the system, second sample light reflected from the object within a third range of wavelengths and in a second field of detection, the third range of wavelengths being a subset of the first range of wavelengths, the third range of wavelengths at least partially overlapping the second range of wavelengths, and the second field of detection being different from the first field of detection;
• determining, using an electronic control module, a distance between the system and the object based on the measured first sample light and the measured second sample light;
• and
• determining, using the electronic control module, a spectral distribution of light corresponding to the object based on the measured first sample light and the measured second sample light.