Condition monitoring apparatus, condition monitoring system, and condition monitoring method

A condition monitoring apparatus that monitors a condition of an object, the condition monitoring apparatus comprising:

• a CPU;
• and
• a non-transitory memory storing a program,
• wherein the program, when executed by the CPU, causes the CPU to perform:
• detecting one or more peaks from a frequency spectrum obtained by frequency analysis of waveform data measured by a sensor provided in the object;
• generating one or more abnormality maps for the frequency spectrum, wherein the one or more abnormality maps each include abnormal components comprising a frequency of one peak of interest selected from among detected peaks and one or more frequencies of one or more peaks that appear together with the peak of interest when the peak of interest is assumed as a peak originating from abnormality of the object, wherein the one or more abnormality maps include information where the frequency and a value 0 or 1 are associated with each other for each frequency, a value corresponding to a frequency of each of the abnormal components is set to 1, and a value corresponding to a frequency not defined as the abnormal components is set to 0;
• selecting one map of interest from the one or more abnormality maps, and extracting one or more abnormal peaks from the detected peaks, wherein the one or more abnormal peaks correspond to one or more peaks, and a difference between a frequency of each of one or more abnormal peaks and a frequency of any of the abnormal components included in the map of interest is equal to or smaller than a prescribed value;
• and
• calculating, based on a spectral density of the one or more abnormal peaks, a first criterion value representing occurrence of abnormality corresponding to the map of interest.