Manufacturing method of a semiconductor memory device
AssigneeSK hynix Inc.
InventorsKun Young Lee, Tae Kyung Kim
Life of this patent
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Abstract
A method of manufacturing a semiconductor memory device includes processing a first substrate including a first align mark and a first structure, processing a second substrate including a second align mark and a second structure, orientating the first substrate and the second substrate such that the first structure and the second structure face each other, and controlling alignment between the first structure and the second structure by using the first align mark and the second align mark to couple the first structure with the second structure.
Claims6
A method of manufacturing a semiconductor memory device, the method comprising:
- processing a first substrate, wherein processing the first substrate comprises:
- disposing a peripheral circuit and a first conductive contact pattern coupled to the peripheral circuit over a first region of the first substrate;
- embedding a sacrificial material in a second region of the first substrate;
- and
- disposing a first align mark over the sacrificial material;
- processing a second substrate, wherein processing the second substrate comprises disposing a second align mark, a memory cell array, and a second conductive contact pattern coupled to the memory cell array over the second substrate;
- orientating the first substrate and the second substrate such that the first conductive contact pattern and the second conductive contact pattern face each other;
- and
- coupling the first conductive contact pattern to the second conductive contact pattern by checking alignment of the first align mark with the second align mark.
Dependencies are inferred from the claim text.