Back to results
US 11,309,175 B2Granted
Multi-reflecting time-of-flight mass spectrometers
AssigneesMicromass UK Limited, Leco Corporation
InventorsJohn Brian Hoyes, Anatoly Verenchikov
Life of this patent
Estimating the term…
Abstract
A multi-reflecting time of flight mass analyser is disclosed in which the ion flight path is maintained relatively small and the duty cycle is made relatively high. Spatial focusing of the ions in the dimension (z-dimension) in which the mirrors (36) are elongated can be eliminated whilst maintaining a reasonably high sensitivity and resolution.
Claims18
A multi-reflecting time of flight mass analyser comprising:
- an ion accelerator;
- two ion mirrors arranged for reflecting ions in a first dimension (x-dimension) and being elongated in a second dimension (z-dimension);
- and
- an ion detector;
- wherein the ion accelerator is arranged and configured for accelerating ions into a first of the ion mirrors at an angle to the first dimension such that the ions are repeatedly reflected between the ion mirrors in the first dimension (x-dimension) as they travel in the second dimension (z-dimension) and wherein the ions are reflected at least four times by the ion mirrors;
- wherein the ions are not spatially focussed in the second dimension (z-dimension) as they travel from the ion accelerator to the detector;
- and
- wherein the mass analyser has a duty cycle of ≥5%, a resolution of ≥20,000, wherein the distance in the first dimension (x-dimension) between points of reflection in the two ion mirrors is ≤1000 mm;
- and wherein the mass analyser is configured such that the ions travel a distance in the second dimension (z-dimension) from the ion accelerator to the detector of ≤700 mm.
6 more elements
A multi-reflecting time of flight mass analyser comprising:
- an ion accelerator;
- two ion mirrors arranged for reflecting ions in a first dimension (x-dimension) and being elongated in a second dimension (z-dimension);
- an ion detector;
- wherein the ion accelerator is arranged and configured for accelerating ions into a first of the ion mirrors at an angle to the first dimension such that the ions are repeatedly reflected between the ion mirrors in the first dimension (x-dimension) as they travel in the second dimension (z-dimension) and such that the ions are reflected at least four times by the ion mirrors;
- and
- wherein the ions are reflected so as to pass from one of the ion mirrors to the other of the ion mirrors n times, and wherein the ions are not spatially focussed in the second dimension (z-dimension) by periodic lenses during ≥60% of these n times;
- and
- wherein the mass analyser has a duty cycle of ≥5%, and a resolution of ≥20,000, wherein the distance in the first dimension (x-dimension) between points of reflection in the two ion mirrors is ≤800 mm, and wherein the mass analyser is configured such that the ions travel a distance in the second dimension (z-dimension) from the ion accelerator to the detector of ≤700 mm.
5 more elements
Dependencies are inferred from the claim text.