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US 11,309,170 B2Granted
Methods for testing or adjusting a charged-particle detector, and related detection systems
AssigneeBiomerieux
InventorJames Arthur VanGordon
Life of this patent
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Abstract
Methods for testing or adjusting a charged-particle detector are provided. A diagnostic and/or adjustment method for a charged-particle detector of an instrument includes providing, from a photon source, photons incident on the charged-particle detector. Moreover, the method includes detecting a response by the charged-particle detector to the photons incident thereon. Related detection systems are also provided.
Claims19
A method for a charged-particle detector of a mass spectrometer, the method comprising:
- receiving photons at the charged-particle detector;
- detecting a response by the charged-particle detector that is independent of any ionizing event in the mass spectrometer;
- measuring a signal gain of the charged-particle detector;
- and
- comparing the signal gain of the charged-particle detector with a predetermined value or with a measured signal gain of another charged-particle detector, in response to an output signal of the charged-particle detector.
2 more elements
A mass spectrometer comprising:
- a housing enclosing an analysis flow path;
- a charged-particle detector;
- a light source configured to provide light inside the housing to generate ions incident on the charged-particle detector;
- and
- a pulsing photon source configured to provide pulses to the charged-particle detector,
- wherein the mass spectrometer is configured to detect a pulsed response by the charged-particle detector that is independent of any ionizing event in the mass spectrometer.
3 more elements
A mass spectrometer comprising:
- a housing enclosing an analysis flow path;
- a charged-particle detector that is configured to receive photons;
- a light source configured to provide light inside the housing to generate ions incident on the charged-particle detector;
- and
- a processor that is configured to detect a response by the charged-particle detector that is independent of any ionizing event in the mass spectrometer,
- wherein the processor is further configured to:
- measure a signal gain of the charged-particle detector;
- and
- compare the signal gain of the charged-particle detector with a predetermined value or with a measured signal gain of another charged-particle detector, in response to an output signal of the charged-particle detector.
6 more elements
Dependencies are inferred from the claim text.