Automatic test equipment method for testing system in a package devices
AssigneeOctavo Systems LLC
InventorKevin Michael Troy
Life of this patent
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Abstract
Systems, methods, and computer program products directed to testing a System-in-a-Package (SIP) using an Automatic Test Equipment (ATE) machine. A functional representation of one or more tests to be performed in the SIP is loaded in a memory located on a load board, the load board located on the ATE machine. A test controller located on at least one of the SIP and the load board is caused to retrieve and store the one or more tests to be performed in the SIP. The test controller is instructed to conduct the one or more tests in the SIP.
Claims20
A method performed by an Automatic Test Equipment (ATE) machine for testing a System-in-a-Package (SIP) using the ATE machine, the method comprising:
- the ATE loading, into a memory, a state machine configured to execute one or more tests in said SIP under test and a functional representation of one or more tests to be performed in said SIP under test, wherein the memory is located on a load board, and said load board is a separate device connected to said ATE machine;
- causing a test controller to retrieve and store from said memory said state machine and to retrieve and store the one or more tests to be performed in the SIP under test, wherein said test controller is one of a microprocessor, a microcontroller, a logic circuit, and configurable logic gates, and
- instructing said test controller to conduct the one or more tests in said SIP under test.
A computer program product comprising a non-transitory computer readable medium storing a computer program for testing a System-in-a-Package (SIP) using an Automatic Test Equipment (ATE) machine, the computer program comprising computer program code which, when run on said ATE machine, causes said ATE machine to perform a set of operations comprising:
- loading, into a memory, a functional representation of one or more tests to be performed in the SIP under test and a state machine configured to execute the one or more tests, wherein the memory is located on a load board, and said load board is a separate device connected to said ATE machine;
- causing a test controller to retrieve and store, from said memory, the state machine and the one or more tests to be performed in the SIP under test;
- and
- instructing the test controller to conduct the one or more tests in the SIP under test.
A method for testing a System-in-a-Package (SIP) using an Automatic Test Equipment (ATE) machine, said ATE machine comprising a load board, the method comprising:
- verifying said load board using said ATE machine;
- conducting one or more power-off tests on the SIP, wherein the SIP is loaded on the load board and wherein the one or more power-off tests comprise a continuity test using said ATE machine;
- conducting one or more power-on tests on the SIP, wherein the one or more power-on tests comprise voltage measurements using said ATE machine;
- and
- instructing a test controller to conduct one or more power-on tests in the SIP by performing a process comprising releasing a reset for the test controller and verifying a boot of the test controller,
- wherein the test controller is located on one of the load board and the SIP, and
- wherein the one or more power-on tests conducted by the test controller comprises a MAC ID read, a DRAM test, a general purpose input output (GPIO) test, an analog-to-digital converter (ADC) test, and one or more frequency tests.
Dependencies are inferred from the claim text.