Memory test apparatus and testing method thereof including built-in self test (BIST)

A memory test apparatus, comprising:

• a memory device;
• and
• a built-in self test (BIST) module configured to access the memory device and execute a test therein, in response to a test command received from test equipment, said BIST module configured to generate an address within the memory responsive to a finite state machine (FSM) operation command, access the memory device and execute a test procedure within the memory device when the test command is the FSM operation command, and execute an auto-operation test on a test region of the memory device based on received address information when the test command is a direct access command;
• wherein the BIST module comprises:
• a command FSM module configured to execute at least one test procedure to access the memory device and execute a test procedure corresponding to the FSM operation command;
• a direct access controller configured to execute the auto-operation test in accordance with the direct access command;
• a multiplexer configured to receive signals generated at an output(s) of the command FSM module and signals generated at an output(s) of the direct access controller, and further configured to receive data output from the memory device in response to the test command received from the test equipment and selectively pass the data to the command FSM module and the direct access controller based on the test command;
• and
• a test interface configured to selectively receive output data from the memory device via the direct access controller but not via the command FSM module.

A memory test apparatus connected between automatic test equipment and a memory device, comprising:

• a test interface which receives a test command from the automatic test equipment and returns a test result;
• and
• a built-in self test (BIST) module which accesses the memory device and executes a test,
• the BIST module autonomously generates an address in accordance with a finite station machine (FSM) operation command, accesses the memory device, and executes a test procedure when the test command is the FSM operation command, and
• the BIST module executes an auto-operation test on a test region of the memory device on received address information when the test command is a direct access command;
• wherein the BIST module includes:
• a command FSM module including at least one test procedure to access the memory device and execute a test procedure corresponding to the FSM operation command;
• and
• a direct access controller which executes the auto-operation test in accordance with the direct access command;
• wherein the memory device provides output data to the command FSM module in response to the FSM operation command;
• wherein the memory device provides output data to the direct access controller in response to the direct access command;
• and
• wherein the test interface receives the output data from the direct access controller in response to the access command, but does not receive the output data from the command FSM module in response to the FSM operation command.