Test circuit for testing a storage circuit

An electronic device comprising:

• a storage circuit comprising a storage block;
• and
• a test circuit configured to test the storage circuit and comprising:
• a test access circuit configured to receive a first access address, a first control command, external test data, and a mode selection signal;
• a controller configured to generate an address signal, a control signal, a data component;
• a pattern-generator circuit generating and providing test data to the storage circuit according to the data component or the external test data, wherein the storage circuit writes the test data into the storage block and reads the storage block to generate read data;
• a comparing circuit comparing the test data and the read data to generate a test result;
• and
• a first register storing the test result,
• wherein the controller determines whether the storage circuit is working normally according to the test result stored in the first register,
• wherein:
• when a characteristic parameter of the mode selection signal meets a first predetermined condition, the test access circuit directs the controller to stop providing the address signal, the control signal, and the data component such that the pattern-generator circuit generates an access address, a control command, and the test data according to the first access address, the first control command, and the external test data and provides the access address, the control command, and the test data to the storage circuit, and
• when the characteristic parameter of the mode selection signal meets a second predetermined condition, the test access circuit directs the controller to provide the address signal, the control signal, and the data component so that the pattern-generator circuit generates the access address, the control command, and the test data according to the address signal, the control signal, and the data component and provides the access address, the control command, and the internal test data to the storage circuit.