Boost bypass circuitry in a memory storage device
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHidehiro Fujiwara, Yen-Huei Chen
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHidehiro Fujiwara, Yen-Huei Chen
Estimating the term…
The present disclosure describes various exemplary memory storage devices that can be programmed to bypass one or more memory cells in a bypass mode of operation. The various exemplary memory storage devices can adjust, for example, pull-up or pull-down, the electronic data as the electronic data passes through these exemplary memory storage devices in the bypass mode of operation. In some situations, the various exemplary memory storage devices may introduce an unwanted bias into the electronic data as the electronic data passes through these exemplary memory storage devices in the bypass mode of operation. The various exemplary memory storage devices can pull-down the electronic data and/or pull-up the electronic data as the electronic data is passing through these exemplary memory storage devices in the bypass mode of operation to compensate for this unwanted bias.
A memory storage device, comprising:
Boost circuitry within a memory storage device, comprising:
A method for operating a memory storage device, the method comprising:
Dependencies are inferred from the claim text.