Method and system for direct access to flash modules
AssigneeYangtze Memory Technologies Co., Ltd.
InventorsXiaodong Xu, Yi Chen
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AssigneeYangtze Memory Technologies Co., Ltd.
InventorsXiaodong Xu, Yi Chen
Estimating the term…
A memory device includes a substrate, a controller disposed on the substrate and providing an external interface, and a plurality of flash memory dies connected to the controller through an internal interface. The external interface includes at least a bypass pin, a mode selection pin, and a data pin, and is used by an external host to direct access the plurality of flash memory dies through the controller. The bypass pin is used to enable the controller to enter in a direct access state in which the mode selection pin and the data pin are operational; and the mode selection pin is used to trigger the controller to receive a mode code on the data pin and to receive a mode code value on the data pin. The mode code indicates one of a plurality of predetermined input-output modes of the controller in the direct access state, and the mode code value determining information under the predetermined input-output mode indicated by the mode code.
A memory device, comprising:
A method for testing a memory device having a substrate, a controller disposed on the substrate and providing an external interface, and a plurality of flash memory dies connected to the controller through an internal interface, the method comprising:
A controller for controlling a plurality of flash memory dies, comprising:
Dependencies are inferred from the claim text.