Analysis apparatus, analysis method, and storage medium
AssigneeFujitsu Limited
InventorsKento Ikkaku, Kazuhito Matsuda, Norinao Kouma
Life of this patent
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AssigneeFujitsu Limited
InventorsKento Ikkaku, Kazuhito Matsuda, Norinao Kouma
Estimating the term…
An analysis method includes acquiring target data collected at edges; determining first analysis target satisfying a first condition, and specifying a first detection position indicating a position at which the first analysis target is detected at the edges and a first detection time; calculating a correlation coefficient of the feature amount; specifying a first range of the first detection position and a second range of the first detection time of the analysis target for which the correlation coefficient satisfies a predetermined relationship; determining second analysis target satisfying a second condition, and specifying a second detection position and a second detection time; determining whether the analysis target in which the second detection position is included in the first range and the second detection time; and acquiring any one of the analysis target from the edges when it is determined that the analysis target is included.
An analysis apparatus, comprising:
An analysis method performed by a computer, the method comprising:
A non-transitory computer-readable storage medium storing a program that causes a computer to execute a process, the process comprising:
Dependencies are inferred from the claim text.