Polarizing plate for minimizing reflecting properties in organic light emitting device

A polarizing plate disposed on the outer surface of a transparent or reflective electrode layer of an organic light emitting device, to which external light reaches first, for preventing reflection of external light and ensuring visibility, the polarizing plate comprising:

• a polarizer;
• and a retardation layer which is laminated on one side of the polarizer,
• wherein a reflectivity in the organic light emitting device with respect to light in an entire wavelengths from 380 nm to 700 nm measure on a side of the polarizer of the polarizing plate is 10% or less with respect to all radial angels at an inclined angle of 50 degrees and the inclined angle is an angle between a normal line of a surface of a polarizing plate and an observation direction,
• wherein the retardation layer comprises a positive uniaxial retardation film and a C plate as retardation film, and the positive uniaxial retardation film is disposed closer to the polarizer than the C plate,
• wherein the thickness direction retardation (Rth) of the C plate according to the equation Rth=d×(Nz−Ny) is more than 0 nm,
• wherein the positive uniaxial retardation film has a first Rth value according to the equation Rth=d×(Nz−Ny), the C plate has a second Rth value according to the equation Rth=d×(Nz−Ny), and the sum of the first and second Rth values is from 40 nm to 130 nm,
• wherein the sum of the in-plane retardation (Rin) values of all of the retardation films comprised in the retardation layer according to the equation Rin=d×(Nx−Ny) is in a rage of 100 nm to 170 nm,
• wherein an angle between a slow axis of the positive uniaxial retardation film and a light absorption axis of the polarizer is from 40 degrees to 50 degrees,
• wherein the Rin of the positive uniaxial retardation film according to the equation Rin=d×(Nx−Ny) with respect to light having a wavelength of 550 nm is in a range of 100 nm to 200 nm such that the positive uniaxial retardation film is capable of exhibiting a ¼ wavelength retardation characteristic,
• wherein, d is a thickness of the retardation film, and Nx, Ny and Nz are refractive indexes with respect to light having a wavelength of 550 nm in x, y and z axes of the retardation film respectively, wherein the x axis is a direction parallel to a slow axis of the retardation film, the y axis is a direction parallel to a fast axis of the retardation film and z axis is a normal direction of a plane formed by the x and y axes.