Waveguide integrated circuit testing

A test apparatus for testing multiple integrated circuit devices under test (DUT) having a radio high frequency (RF) wave port located on the DUT, comprising:

• f. an array of test housings each having a receiver for a DUT, said housing being arranged around a central axis;
• g. each housing being associated with a RF transmitting horn antenna having proximal central aperture and a wider distal aperture and defining a transmitter horn axis therebetween;
• h. a circumferential adapter element size to surround said DUT RF port having a first end located proximate said RF wave port and having a bias element to maintain engagement between said RF port and said adapter;
• i. a receiving RF horn antenna located generally above said array and proximate said central axis and said adapter;
• j. said RF transmitting horn antennas being oriented so that the horn axis generally points to said receiving horn where the transmitting axis intersects said central axis.

A method of testing a plurality of radio frequency transmitting devices under test (DUT), each DUT having a RF output port, comprising the steps of:

• a. locating a plurality of DUTs in an array with each RF output port being oriented in the same direction;
• b. locating a transmitting RF waveguide horn proximate the DUT output port on DUT;
• c. locating a receiving wave guide horn proximate the array but spaced therefrom and generally central to the array;
• d. pointing the transmitting RF waveguide horns in the array at an angle toward the receiving horn;
• e. sequentially testing each of DUTs in the array and sequentially receiving RF signals from each of said DUTs at said receiving horn.