Quality detection device, quality detection method, and integrated probe assembly

A quality detection device, comprising an integrated probe set, a driving module, and a collecting module;

• wherein the integrated probe set comprises a plurality of integrated probe assemblies;
• the integrated probe assemblies are disposed in pairs and each of the integrated probe assemblies comprises a driving end and a collecting end;
• the driving end of one integrated probe assembly is matched with the driving end of another integrated probe assembly disposed in pairs with the one integrated probe assembly;
• the collecting end of one integrated probe assembly is matched with the collecting end of another integrated probe assembly disposed in pairs with the one integrated probe assembly;
• the driving module releases current to form a current loop with a conductor by driving both of the driving ends of the one integrated probe assembly and the another integrated probe assembly, where the driving ends abut against the conductor;
• the collecting module obtains a resistance value of an area of the current loop formed in the conductor, where the collecting ends abut against the conductor;
• wherein the integrated probe assemblies comprise a first probe disposed on an outer side of the integrated probe assemblies and a second probe disposed in an inner side of the integrated probe assemblies;
• an end face of the first probe and an end face of the second probe are disposed in a same level when the integrated probe assemblies abut against the conductor;
• wherein the first probe is one of the driving end and the collecting end;
• and the second probe is the other one of the driving end and the collecting end;
• wherein the quality detection device further comprises a moving assembly configured to fix the integrated probe assemblies;
• the moving assembly is connected with a support or the conductor to realize relative movement of the support and the conductor;
• the support comprises fixing ends disposed in two rows, the fixing ends respectively fix the corresponding integrated probe assemblies;
• and the moving assembly drives the support to move such that the integrated probe assemblies disposed in pairs abut against two sides of a welded seam of the corresponding conductor;
• wherein the quality detection device comprises a workbench, a conductor clamping end disposed on a center of the workbench, and the support is disposed on two sides of the workbench;
• the moving assembly is disposed between the workbench and the support to drive the support to move inwards or outwards along the workbench.