Determining a characteristic of a substrate
AssigneeHewlett-Packard Development Company, L.P.
InventorsPeter Morovic, Jan Morovic, Hector Gomez Minano, Marcos Casaldaliga Albisu, Joan Jordi Coll Sicluna
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AssigneeHewlett-Packard Development Company, L.P.
InventorsPeter Morovic, Jan Morovic, Hector Gomez Minano, Marcos Casaldaliga Albisu, Joan Jordi Coll Sicluna
Estimating the term…
A method is described in which a reflection is obtained of a laser light pattern reflected from a substrate. A reflection of diffuse light may be obtained from the substrate. A first parameter may be determined, relating to the substrate from the reflected laser light pattern. A second parameter may be determined, relating to the substrate from the reflected diffuse light and a characteristic of the substrate may be determined from the first and second parameters. A print apparatus and a machine-readable medium are also disclosed.
A method, comprising:
A print apparatus, comprising:
A non-transitory machine-readable medium storing instructions which, when executed by a processor, cause the processor to:
Dependencies are inferred from the claim text.