Coated cutting tool
AssigneeTungaloy Corporation
InventorKatsuya Ishii
Life of this patent
Estimating the term…
Abstract
A coated cutting tool of the present invention comprises a substrate and a coating layer formed on a surface of the substrate, wherein the coating layer comprises a lower layer and an upper layer formed on a surface of the lower layer, the lower layer comprises a specified Ti compound layer having a specified average thickness, the upper layer comprises an α-aluminum oxide layer having a specified average thickness, the Ti compound layer comprises at least one Ti carbonitride layer, the Ti carbonitride is composed of Ti(CxN1-x) (0.65<x≤0.90), and a texture coefficient TC(331) of a (331) plane in the Ti carbonitride layer satisfies a specified range.
Claims11
A coated cutting tool comprising a substrate and a coating layer formed on a surface of the substrate, wherein
- the coating layer comprises a lower layer and an upper layer formed on a surface of the lower layer,
- the lower layer comprises a Ti compound layer comprising one or more layers selected from the group consisting of a Ti carbide layer, a Ti nitride layer, a Ti carbonitride layer, a Ti oxycarbide layer, and a Ti oxycarbonitride layer,
- an average thickness of the lower layer is 3.0 μm or more and 15.0 μm or less,
- the upper layer comprises an α-aluminum oxide layer,
- an average thickness of the upper layer is 3.0 μm or more and 15.0 μm or less,
- the Ti compound layer comprises at least one Ti carbonitride layer,
- the composition of the Ti carbonitride layer is represented by the following formula (i):
- Ti(CxN1-x) (i),
- wherein in the formula, x represents an atomic ratio of a C element to a total of the C element and an N element in the Ti carbonitride layer, and satisfies 0.65<x≤0.90, and
- in the Ti carbonitride layer, a texture coefficient TC(331) of a (331) plane represented by a following formula (1) is 1.5 or more and 4.0 or less:
- T
-
- C
-
- (
- 3
-
- 3
-
- 1
- )
- =
- I
-
- (
- 33
-
- 1
- )
- I
- 0
-
- (
- 3
-
- 3
-
- 1
- )
-
- {
- 1
- 8
-
- ∑
- I
-
- (
- hkl
- )
- I
- 0
-
- (
- hkl
- )
- }
- -
- 1
- ,
- (
- 1
- )
- wherein in the formula (1), I(hkl) represents a peak intensity of an (hkl) plane in X-ray diffraction of the Ti carbonitride layer, I0(hkl) represents an average value of a standard diffraction intensity of the (hkl) plane of Ti carbide in a JCPDS card number 32-1383 and a standard diffraction intensity of the (hkl) plane of Ti nitride in a JCPDS card number 32-1420, and (hkl) indicates eight crystal planes (111), (200), (220), (311), (331), (420), (422), and (511) and
- wherein grains constituting the Ti carbonitride layer have an average grain size of 0.3 μm or more and 2.0 μm or less.
Dependencies are inferred from the claim text.