Inspection system and method for analysing defects

An inspection system for analysing defects in transformer laminations, wherein the inspection system comprises a detection unit, a conveyance device, a measuring device including a position sensor and/or a distance sensor placed before the detection unit in the direction of movement and a position sensor and/or a distance sensor placed after the detecting device in the direction of movement, and a processing device, wherein the detection unit includes an optical detecting device, wherein the conveyance device is used to continuously transport a plurality of transformer laminations relative to the detecting device, wherein the detecting device is arranged transversely to a direction of movement of the plurality of transformer laminations, wherein a velocity of movement of at least one of the plurality of transformer lamination relative to the detecting device is measured via a measurement device of the detection unit, the measurement device measures a distance of completed movement and/or the velocity of movement of the at least one of the plurality of transformer laminations directly at the at least one of the plurality of transformer laminations with the optical detecting device, an image of a contour of the at least one of the plurality of transformer laminations is captured with the detecting device, images of the at least one of the plurality of transformer laminations are assembled into a combined image of the at least one of the plurality of transformer laminations via the processing device while considering the velocity of movement of the at least one of the plurality of transformer laminations, a shape of the at least one of the plurality of transformer laminations is determined on the basis of the combined image and a difference between a velocity of movement measured at one end of the at least one of the plurality of transformer laminations and a velocity of movement measured at an opposite end of the at least one of the plurality of transformer laminations via the processing device, and measurement data from the position sensor and/or the distance sensor placed before the detecting device in the direction of movement and subsequently from a position sensor and/or distance sensor placed after the detecting device in the direction of movement is processed by the processing device.