SiC composite substrate and method for manufacturing same
AssigneesShin-Etsu Chemical Co., Ltd., Cusic Inc.
InventorsYoshihiro Kubota, Shoji Akiyama, Hiroyuki Nagasawa
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AssigneesShin-Etsu Chemical Co., Ltd., Cusic Inc.
InventorsYoshihiro Kubota, Shoji Akiyama, Hiroyuki Nagasawa
Estimating the term…
Provided is an SiC composite substrate 10 having a monocrystalline SiC layer 12 on a polycrystalline SiC substrate 11, wherein: some or all of the interface at which the polycrystalline SiC substrate 11 and the monocrystalline SiC layer 12 are in contact is an unmatched interface I12/11 that is not lattice-matched; the monocrystalline SiC layer 12 has a smooth obverse surface and has, on the side of the interface with the polycrystalline SiC substrate 11, a surface that has more pronounced depressions and projections than the obverse surface; and the close-packed plane (lattice plane 11p) of the crystals of the polycrystalline SiC in the polycrystalline SiC substrate 11 is randomly oriented with reference to the direction of a normal to the obverse surface of the monocrystalline SiC layer 12. The present invention improves the adhesion between the polycrystalline SiC substrate and the monocrystalline SiC layer.
An SiC composite substrate comprising a polycrystalline SiC substrate and a monocrystalline SiC layer thereon, wherein the entirety or a part of the interface of the polycrystalline SiC substrate in abutment with the monocrystalline SiC layer is a mismatch interface that is not lattice-matched, the monocrystalline SiC layer has a smooth front surface and a surface on the side of the interface with the polycrystalline SiC substrate that is more rugged than the front surface, said rugged surface of the monocrystalline SiC layer is composed of oblique surface segments randomly oriented with reference to a direction normal to the front surface of the monocrystalline SiC layer, and the close-packed planes of polycrystalline SiC crystals in the polycrystalline SiC substrate are parallel to said oblique surface segments and correspondingly randomly oriented with reference to a direction normal to the front surface of the monocrystalline SiC layer.
Dependencies are inferred from the claim text.