Automated implant movement analysis systems and related methods
AssigneeSectra AB
InventorsOlof Sandberg, Claes Lundström
Life of this patent
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AssigneeSectra AB
InventorsOlof Sandberg, Claes Lundström
Estimating the term…
Methods, systems, workstations, and computer program products that provide automated implant analysis of batches of image data sets of a plurality of different patients having an implant coupled to bone using a first data set of a first patient from the batch of image data sets, the first data set comprising a first image stack and a second image stack and allowing a user to select parameter settings for implant movement analysis of the implant including selecting a first object of interest and a second reference object. Measurements of movement of the implant and/or coupled bone can be automatically calculated and selected parameter settings can be automatically propagated to other image data sets of other patients of the batch of image data sets and measurements for the batch of image data sets of others of the different patients can be automatically calculated.
An automated implant analysis method comprising:
Dependencies are inferred from the claim text.