Analog-to-digital converter having quantization error duplicate mechanism

Abstract

The present invention provides an ADC including a first switched capacitor array, a second switched capacitor array, a third switched capacitor array, an integrator and a quantizer. The first switched capacitor array is configured to sample the input signal to generate a first sampled signal. The second switched capacitor array is configured to sample the input signal to generate a second sampled signal and generate a first quantization error. The third switched capacitor array is configured to sample the input signal to generate a third sampled signal and generate a second quantization error. The integrator is configured to receive the first quantization error and the second quantization error in a time-interleaving manner, and integrate the first/second quantization error to generate an integrated quantization error. The quantizer is configured to quantize the first sampled signal by using the integrated quantization error as a reference voltage to generate a digital output signal.

Dependencies are inferred from the claim text.