Embedded antenna array metrology systems and methods
AssigneeRockwell Collins, Inc.
InventorsAdrian A. Hill, Connor C. McBryde
Life of this patent
Estimating the term…
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AssigneeRockwell Collins, Inc.
InventorsAdrian A. Hill, Connor C. McBryde
Estimating the term…
An antenna array testing circuit can include a circuitry including a plurality of memory registers, a testing sequence generation logic, and a testing control logic. The memory registers can store, for each antenna element of a plurality of antenna elements of the phased antenna array, a corresponding antenna element ID. The memory registers can store a testing step ID indicative of a testing step of a sequence of testing steps. The testing sequence generation logic can determine, for each antenna element of the phased antenna array, using the corresponding antenna element ID and the testing step ID, a corresponding testing signal indicative of a testing state of the antenna element during the testing step. The testing control logic can cause each antenna element the phased antenna array to be configured according to the corresponding testing signal during the testing step.
An antenna array testing circuit for testing a phased antenna array, the antenna array testing circuit comprising:
A method of testing a phased antenna array using a testing circuit integrated in an integrated circuit of the phased antenna array, the method comprising:
A phased antenna array comprising:
Dependencies are inferred from the claim text.