US 11,114,181 B1 · Memory devices with redundant memory cells for replacing defective memory cells, and related systems and methods

Abstract

Memory devices are disclosed. A memory device may include a memory array including a number of memory cells partitioned into a number of memory segments. Each of the number of memory segments may include a redundant memory-cell group configurable to be accessed instead of a defective memory-cell group of the memory segment. The memory device may also include a set of latches configurable to indicate that a redundant memory-cell group of a memory segment of the number of memory segments is to be accessed instead of a defective memory-cell group of the memory segment. The set of latches may include segment latches configurable to indicate the memory segment or a status of the set of latches. The set of latches may also include address latches configurable to indicate the defective memory-cell group within the memory segment. Related systems and methods are also disclosed.

Claims24

Dependent claims

A device, comprising:

a memory array including a number of memory cells partitioned into a number of memory segments, each of the number of memory segments including a redundant memory-cell group configurable to be accessed instead of a defective memory-cell group of the memory segment;
and
a set of latches configurable to indicate that a redundant memory-cell group of a memory segment of the number of memory segments is to be accessed instead of a defective memory-cell group of the memory segment, the set of latches including:
segment latches configurable to indicate one of the memory segments or a status of the set of latches;
and
address latches configurable to indicate the defective memory-cell group within the memory segment.

3 more elements

A system, comprising:

an input device;
an output device;
a processor device operably coupled to the input device and the output device;
and
a memory device operably coupled to the processor device, the memory device comprising:
a number of memory cells partitioned into a number of memory segments, each of the number of memory segments including a redundant memory-cell group configurable to be replace a defective memory-cell group of the memory segment;
and
a number of sets of latches, each of the number of sets of latches configurable to indicate that a redundant memory-cell group of a memory segment of the number of memory segments is to replace a defective memory-cell group of the memory segment, each of the number of sets of latches including segment latches configurable to indicate a memory segment and address latches configurable to indicate the defective memory-cell group within the memory segment, the number of sets of latches including:
an unused set of latches including unused segment latches configured to not indicate a memory segment of the number of memory segments;
an active set of latches including active segment latches configured to indicate a memory segment of the number of memory segments that includes a defective memory-cell group to be replaced by a redundant memory-cell group;
and
a decommissioned set of latches including decommissioned segment latches configured to not indicate a memory segment of the number of memory segments.

9 more elements

Dependencies are inferred from the claim text.

Memory devices with redundant memory cells for replacing defective memory cells, and related systems and methods

Life of this patent

Memory devices with redundant memory cells for replacing defective memory cells, and related systems and methods

Life of this patent

Abstract

Claims24