Machine-learning based scan design enablement platform

A computer system for optimizing a grouping of a plurality of scan flip-flops into a plurality of scan chains within electronic circuitry of an electronic device, the computer system comprising:

• a memory that stores one or more instructions;
• and
• a processor configured to execute the one or more instructions, the one or more instructions, when executed by the processor, configuring the processor to:
• perform a statistical cost analysis of a plurality of characteristics, parameters, or attributes of a plurality of electrical connections between the plurality of scan flip-flops to identify a non-optimum electrical connection from among the plurality of electrical connections;
• identify a scan flip-flop from among the plurality of scan flip-flops corresponding to the non-optimum electrical connection, the identified scan flip-flop being from among a first group of scan flip-flops from among the plurality of scan flip-flips that are grouped to form a first scan chain from among the plurality of scan chains;
• and
• move the identified scan flip-flop from the first group of scan flip-flops to a second group of scan flip-flops from among the plurality of scan flip-flips that are grouped to form a second scan chain from among the plurality of scan chains.

A method for grouping and ordering a plurality of scan flip-flops within electronic circuitry of an electronic device, the method comprising:

• performing a cluster analysis of the plurality of scan flip-flops to group the plurality of scan flip-flops into a plurality of scan chains;
• performing a routing analysis of scan flip-flops within each scan chain from among the plurality of scan chains to determine a plurality of electrical connections for the plurality of scan flip-flops;
• performing a statistical cost analysis of a plurality of characteristics, parameters, or attributes of the plurality of electrical connections between the plurality of scan flip-flops to identify a non-optimum electrical connection from among the plurality of electrical connections;
• identifying a scan flip-flop from among the plurality of scan flip-flops corresponding to the non-optimum electrical connection, the identified scan flip-flop being from among a first group of scan flip-flops from among the plurality of scan flip-flips that are grouped to form a first scan chain from among the plurality of scan chains;
• and
• moving the identified scan flip-flop from the first group of scan flip-flops to a second group of scan flip-flops from among the plurality of scan flip-flips that are grouped to form a second scan chain from among the plurality of scan chains.