Back to results
US 11,112,453 B2Granted
Self testing fault circuit apparatus and method
AssigneeLeviton Manufacturing Co., Inc.
InventorsMichael Ostrovsky, Adam Kevelos
Life of this patent
Estimating the term…
Abstract
A process for self testing a fault circuit includes disabling an actuator, performing a self-test by creating a simulated fault signal across at least a portion of a half cycle of a first polarity and across at least a portion of a half cycle of a second polarity, and determining whether the self-test was successful.
Claims46
A self-testing fault circuit interrupter device comprising:
- a) a fault circuit comprising:
- i) a line monitoring circuit;
- ii) a line interrupting circuit comprising contacts;
- and
- iii) a fault detector circuit which is configured to selectively operate the line interrupting circuit when a fault is detected from the line monitoring circuit;
- b) a self-test circuit including a microcontroller, the self-test circuit configured to conduct a self-test on the fault circuit;
- c) a timing circuit configured to control a duration of an output of the fault detector circuit.
4 more elements
A self-testing fault circuit interrupter device comprising:
- a) a fault circuit comprising:
- i) a line monitoring circuit;
- ii) a line interrupting circuit;
- and
- iii) a fault detector circuit which is configured to selectively operate the line interrupting circuit when a fault is detected from the line monitoring circuit;
- b) a self-test circuit configured to conduct a self-test on the fault circuit;
- c) a timing circuit configured to control a duration of an output of the fault detector circuit.
4 more elements
A self-testing fault circuit interrupter device comprising:
- a) a fault circuit comprising:
- i) a line monitoring circuit;
- ii) a line interrupting circuit;
- and
- iii) a fault detector circuit which is configured to selectively operate the line interrupting circuit when a fault is detected from the line monitoring circuit;
- b) a self-test circuit configured to conduct a self-test on the fault circuit, the self-test circuit configured to selectively operate the line interrupting circuit;
- c) a timing circuit configured to control a duration of an output of the fault detector circuit.
4 more elements
Dependencies are inferred from the claim text.