Test method for semiconductor devices and a test system for semiconductor devices

A test method for a semiconductor device, comprising:

• sequentially loading a test tray having semiconductor devices of first and second lots arranged thereon into first and second tester handlers which perform different test programs;
• storing lot information of each of the semiconductor devices when the semiconductor devices are loaded into the first and second tester handlers;
• sequentially performing the test programs on the semiconductor devices in the first tester handler, and then, sequentially performing the test programs on the semiconductor devices in the second tester handler;
• matching the ID information with the lot information of each of the semiconductor devices when each of the test programs is performed, to generate lot sorting information;
• and
• after performing a final test program, sorting the semiconductor devices based on test results and the lot sorting information.

A test system for a semiconductor device, comprising:

• a tester configured to test semiconductor devices;
• a tester server connected to the tester, and configured to provide a test program to the tester and configured to match ID information with lot information of each of the semiconductor devices to generate lot sorting information when the test program is performed;
• and
• a tester handler connected to the tester, and configured to load and unload the semiconductor devices into and from a test chamber to electrically test the semiconductor devices and configured to sort the semiconductor devices based on test results and the lot sorting information,
• wherein a test tray having the semiconductor devices of first and second lots arranged thereon is loaded into the tester handler, and
• the tester performs the test program on the semiconductor devices of the first and second lots on the test tray at the same time.