Non-contact electrical parameter measurement device with clamp jaw assembly
AssigneeFluke Corporation
InventorsJeffrey E. Worones, Ginger M. Woo, Chris Corrigan, Yinzi Liang
Life of this patent
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AssigneeFluke Corporation
InventorsJeffrey E. Worones, Ginger M. Woo, Chris Corrigan, Yinzi Liang
Estimating the term…
Systems and methods are provided for measuring electrical parameters in a conductor without requiring a galvanic connection. A device includes a body and a clamp jaw assembly movable between an open position that allows a conductor to be moved into a measurement area, and a closed position that secures the conductor within the measurement area. The clamp jaw assembly includes sensors positioned inside a clamp jaw of the clamp jaw assembly. A user may apply a force to an actuator to move the clamp jaw assembly from the closed position into the open position so that the conductor may be positioned and secured in the measurement area. The clamp jaw assembly includes a visual indicator to guide the user to position the conductor within an optimal region in the measurement area. The clamp jaw assembly is sized and dimensioned to automatically position the conductor within the optimal region during measurements.
An electrical parameter measurement device, comprising:
A clamp jaw assembly for measuring an electrical parameter in an insulated conductor, the clamp jaw assembly comprising:
A device for measuring an electrical parameter in an insulated conductor, the device comprising:
Dependencies are inferred from the claim text.