Microparticle measurement device and cleaning method for microparticle measurement device

A cleaning method for a microparticle measurement device, comprising:

• moving a light detection unit from a specific detection position in the microparticle measurement device;
• and
• cleaning the microparticle measurement device based on the movement of the light detection unit,
• wherein the microparticle measurement device includes:
• a light emission unit configured to emit first light to a microparticle;
• the light detection unit configured to detect, at the specific detection position, second light generated from the microparticle;
• an analysis unit connected to the light detection unit,
• wherein the analysis unit is configured to analyze a detection value of the second light detected by the light detection unit;
• and
• a rotational shaft portion connected to the light detection unit, wherein
• the rotational shaft portion is configured to define a specific rotational axis, and
• the light detection unit is rotatable around the specific rotational axis with respect to the specific detection position.