Measurement device, measurement system, and measurement method
AssigneeSeiko Epson Corporation
InventorKeishi Omori
Life of this patent
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AssigneeSeiko Epson Corporation
InventorKeishi Omori
Estimating the term…
There is provided a measurement device including a data acquisition unit that acquires pieces of first to third data output from first to third sensors provided on a structure, an abnormality determination unit that determines whether or not each of the sensors is abnormal, a moving object detection unit that detects a moving object based on at least one of the first data and the second data, and a displacement amount calculation unit that calculates a displacement amount of the structure based on the third data, in which, when the first sensor provided on a main girder closest to an i-th lane of the structure or a main girder second closest to the i-th lane is not abnormal, the moving object detection unit detects the moving object moving on the i-th lane based on the first data output from the first sensor.
A measurement device comprising:
A measurement method comprising:
Dependencies are inferred from the claim text.