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US 11,079,428 B2Granted
Test circuit and method
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHsieh-Hung Hsieh, Yen-Jen Chen, Tzu-Jin Yeh
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Abstract
A test circuit includes an amplifier configured to receive an AC signal, and output an amplified AC signal based on the AC signal, a first detection circuit configured to generate a first DC voltage having a first value based on an amplitude of the AC signal, and a second detection circuit configured to generate a second DC voltage having a second value based on an amplitude of the amplified AC signal.
Claims20
A test circuit comprising:
- an amplifier configured to receive an alternating current (AC) signal, and output an amplified AC signal based on the AC signal;
- a first detection circuit configured to generate a first direct current (DC) voltage having a first value based on an amplitude of the AC signal;
- and
- a second detection circuit configured to generate a second DC voltage having a second value based on an amplitude of the amplified AC signal.
1 more element
An integrated circuit (IC) comprising:
- an amplifier coupled between a first node and a second node;
- a first detection circuit coupled between the first node and a first pad positioned in a scribe line of a semiconductor wafer;
- and
- a second detection circuit coupled between the second node and a second pad positioned in the scribe line,
- wherein
- the amplifier is configured to generate an amplified alternating current (AC) signal at the second node based on a variable gain and an AC signal on the first node,
- the first detection circuit is configured to output a first direct current (DC) voltage to the first pad, the first DC voltage having a first value based on an amplitude of the AC signal, and
- the second detection circuit is configured to output a second DC voltage to the second pad, the second DC voltage having a second value based on an amplitude of the amplified AC signal.
5 more elements
A method of measuring an alternating current (AC) amplifier gain, the method comprising:
- using an AC amplifier to generate an amplified AC signal from a received AC signal;
- outputting a first DC voltage to a first pad of a semiconductor wafer, the first DC voltage having a first value based on an amplitude of the AC signal;
- and
- outputting a second DC voltage to a second pad of the semiconductor wafer, the second DC voltage having a second value based on an amplitude of the amplified AC signal.
1 more element
Dependencies are inferred from the claim text.