Test jig for testing electrical characteristics of semiconductor product
AssigneeMitsubishi Electric Corporation
InventorDaisuke Ikeda
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Abstract
A test jig for testing electrical characteristics of a semiconductor product includes a conductive ground block for supporting the semiconductor product thereon; a substrate provided on the ground block, and having a first and a second substrate electrodes formed on the substrate for the respective electrodes to be in contact with leads of the semiconductor; and lead pressers for pressing the leads against the first and the second substrate electrodes, respectively, so that electrical connection is established between the respective leads and the first and the second substrate electrodes in testing the semiconductor product.
Claims7
A test jig for testing electrical characteristics of a semiconductor product, comprising:
- a substrate having a first substrate electrode and a second substrate electrode formed for testing a semiconductor product having leads;
- a conductive ground block configured to movably support the semiconductor product and/or the substrate;
- lead pressers disposed so as to be movable to positions opposite to the first substrate electrode and the second substrate electrode on the substrate and configured to press the leads against the first substrate electrode and the second substrate electrode at the opposite positions, respectively, and the lead pressers each have a spring-supported pressing electrode changeable in position, wherein
- electrical contact is established between the leads and the first and the second substrate electrodes to test electrical characteristics of the semiconductor product by moving to the opposite positions the ground block or the lead pressers to bring the leads into contact with the first substrate electrode and the second substrate electrode, respectively.
Dependencies are inferred from the claim text.