Surface charge measurement
AssigneeMalvern Panalytical Limited
InventorsJason Corbett, Fraser McNeil-Watson, Robert Jack
Life of this patent
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AssigneeMalvern Panalytical Limited
InventorsJason Corbett, Fraser McNeil-Watson, Robert Jack
Estimating the term…
The invention relates to methods and apparatus for determining properties of a surface. Embodiments disclosed include an apparatus for measuring a surface charge of a sample, comprising: a sample holder having an opposed pair of electrodes and configured to hold a sample in position in a measurement volume between the electrodes such that a planar surface of the sample is aligned orthogonal to the electrode surfaces; a measurement chamber for containing a measurement liquid and having an open end configured to receive the sample holder to position the electrodes in a preset orientation; a laser light source positioned and configured to direct a laser beam through the measurement chamber between the electrodes and parallel to the planar surface of the sample when the sample holder is received in the measurement chamber; and a detector positioned and configured to detect scattered light from the measurement volume, wherein the apparatus is configured to allow for detection of the scattered light by the detector over a range of distances from the surface of the sample.
An apparatus for determining a zeta potential of a planar surface of a sample, comprising:
A method of determining zeta potential of a planar surface of a sample, comprising:
Dependencies are inferred from the claim text.